Special software is required to use some of the files in this section: .mov.
The videos below demonstrate techniques and introduce instruments discussed in this course. Bob Barsotti, Bryan Cord, and Ben Wunsch worked on the Atomic Force Microscope video. Bryan Cord created the other videos.
Demonstration video of SEM inspection of a sample.
Video of sputtering of Au-Pd charge-suppression layer on sample prior to SEM inspection.
Video of cleaving and mounting process for SEM cross-section analysis of a sample.
Demo video for Dektak surface profilometer.
Demo video for Veeco Nanoscope III AFM.
Video demonstration of spin-coating a sample with photoresist.
Video demonstration of contact lithography using the Tamarack i-line system in the NSL.